钙钛矿太阳能电池(PSCs)有望成为新一代的光伏技术。然而，不稳定性问题仍然是阻碍其商业化的主要障碍。由于钙钛矿对高温、湿度、光照等外界压力敏感，而钙钛矿在这些复合压力下的分解会大大加剧和加速PSCs的降解，因此复合压力下的稳定性老化试验被认为是PSCs稳定性评价中最苛刻、最重要的要求。本文主要分析了PSCs在高温、湿度和光照条件下的降解机理。总结了近年来在85%相对湿度/85°C湿热老化试验和光高温诱导降解老化试验等复合应激条件下提高PSCs稳定性的研究进展。在本综述的最后，对提高PSCs稳定性的有效策略的进一步发展进行了预测。
Figure 1(a) HAADF STEM image and EDX elements content distribution map of the device with structure FTO/TiO2/Perovskite/Spiro-OMeTAD/Au [reproduced with permission from Ducati et al., Nanoscale9, 4700 (2017). Copyright 2017 Royal Society of Chemistry]. (b) Schematic diagram of bias experiment with two devices on the same substrate. Experiment condition: 70 °C in N2atmosphere, +2 and −2 V bias was applied every 30 minutes for 16 h. (c) Top view of the sample after bias experiment. (d) ToF-SIMS of the samples before and after bias experiment [reproduced with permission from Abate et al., Energy Environ. Sci.10, 604 (2017). Copyright 2017 Royal Society of Chemistry].
Figure 2 (a)-(d) Possible stability curves. (e)-(f) Schematic diagram of different calculation methods for T80 [reproduced with permission from Mark V. Khenkin et al., Nat. Energy 5, 35 (2020). Copyright 2020 Springer Nature].
Figure 3 (a) Operational stability in air of unpackaged devices TiO2/FAMACs/HTM/Au using spiro-OMeTAD and EH44 as HTL,respectively.(b) Operational stability in air of unpackaged devices ETL/FAMACs/EH44/MoOx/Al using TiO2and SnO2as ETL, respectively [reproduced with permission from Jeffery A. Christians et al., Nat. Energy3, 68 (2018). Copyright 2018 Springer Nature].(c) Operational stability under continuous 1 sun equivalent light in N2atmosphere of three different devices. (d) Comparison of color changes of three different HTL P3HT, PDCBT andspiro-MeOTAD under iodine steam [reproduced with permission from Y. Hou et al., Science358, 6367 (2017). Copyright 2017 Science]. (e)-(h) Schematic diagram of two different packaging methods and photos of packaging devices [reproduced with permission from Y. Hanet al., J. Mater. Chem. A3, 8139 (2015). Copyright 2015 Royal Society of Chemistry].
Figure 4 (a) 85% RH/85 °C and 1 sun light soaking agingtest for encapsulated devices. (b) J-Vcurve changes before and after aging of devices with different thickness of HTL [reproduced with permission from Heoet al., Adv. Mater.4, 1800390 (2019). Copyright 2019 WILEY-VCH]. (c) Schematic diagram of device structure. (d) SEM section diagram of device. (e) J-Vcurve of device. (f) 85% RH/85 °C agingtest for encapsulated devices [reproduced with permission from Azmi et al., Science376, 73 (2022). Copyright 2022 Science].
Figure 5(a) The stability of unencapsulated device with structure of FTO/TiO2/CsFAMAPbI3-xBrx/CuSCN/rGO/Au at MPP 60 °C in N2[reproduced with permission from Arora et al., Science358, 768 (2017). Copyright 2017 Science]. (b) The stability of encapsulated device with structure of FTO/NiO/(FA0.83MA0.17)0.95Cs0.05Pb(I0.9Br0.1)-BMIMBF4/PCBM/BCP/Cr/Cr2O3/Au under full-spectrum sunlight at 70-75 °C [reproduced with permission from Bai et al., Nature571, 245 (2019). Copyright 2019 Springer Nature]. (c) The stability of unencapsulated device with structure of FTO/PolyTPD:F4TCNQ/Cs0.17FA0.83Pb(I1-xBrx)3-[BMP]+[BF4]−/PCBM/BCP/Cr/Au under full-spectrum sunlight at 60 °C. (d) The stability of encapsulated device with structure of FTO/PolyTPD:F4TCNQ/Cs0.17FA0.83Pb(I1-xBrx)3-[BMP]+[BF4]−/PCBM/BCP/Cr/Au under full-spectrum sunlight at 85 °C [reproduced with permission from Lin et al., Science369, 96 (2020). Copyright 2020 Science].
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